ENCYCLOPEDIA OF RADIO ELECTRONICS AND ELECTRICAL ENGINEERING Universal probe. Encyclopedia of radio electronics and electrical engineering Encyclopedia of radio electronics and electrical engineering / Measuring technology Those who are engaged in repairs or just radio amateurs know how often it is necessary to check semiconductors for the integrity of pn junctions. This usually doesn't cause problems. But look at how it's done. We turn on the tester, set it to the desired mode of operation, holding both the probes and the transistor under test with our fingers, connect "+" to the base, "-" to the collector, read the readings, then "-" to the emitter, look at the tester again, after that everything is vice versa . The transistor will slip out of your hands a couple of times during the test. You can try to put it on the table and "feel" there, or try to use "crocodiles" instead of probes (you have to manage not to close the transistor leads with them) - all this is no better than the first option. This also includes a lot of dialing of other elements, such as fuses, low-resistance resistors, acoustic emitters, etc. Solution to the problem: probe. Simple, convenient. Look at the well-known scheme: We connect the tested diode or transistor junction to the contacts in the form of 2 plates. One of the LEDs lights up depending on the direction of the transition. Both light up - the transition is broken, none of them light up - a break. Thus, the diode is checked by one touch of the leads to the probe contacts, the transistor - by two or three (it is also advisable to check the absence of a short circuit between the collector and the emitter). Change the power source to autonomous: Or another option: See also "Radio" 1995, No. 6, p. 28 (A. Karabutov. "Test of semiconductor devices"); 1999, no. 9, p. 51 (G. Chagin. "Probe for checking pn junctions"). The basis of all of them is a generator with a frequency of several tens of Hz with a paraphase output. Each of the schemes shown in the figures has its own advantages and disadvantages for using them in a probe. The first one has a low output current at a supply voltage of 3 V. It can be solved by using super bright (low power) LEDs. However, even in this case, when, for example, LEDs ring, the total voltage drop in the circuit will be too large and the current through the LEDs will approach zero. Increasing the supply voltage sharply increases the current consumed by the generator. The second circuit has a fairly large output current, but the current consumption in standby mode reaches 60 μA, which will require the use of a power switch when using "clock" elements (G-8, LR-43, LR-44, etc.). And this is an additional inconvenience. Due to the complication, we obtain a circuit with the required parameters: A generator is built on the elements DD1.1, DD1.2. DD1.3 and DD1.4 are used as an inverter with increased load capacity. Transistors VT1, VT2, when XP1 and XS3 are closed, open alternately, respectively, HL1 and HL2 light up in their collector circuits. Since this happens at a frequency of several tens of Hz, their glow seems to be continuous. If a VDx diode is connected to the specified contacts, for example, in the same polarity as shown in the diagram, only HL2 will glow. XS2 is used to determine the polarity of voltage sources with a level from 1 to tens of V. When a positive voltage is applied to XP1 relative to XS2, HL1 lights up, negative - HL2, variable - both LEDs. XS1 is used to test capacitors from fractions to several hundred microfarads. When Cx is connected, as indicated in the diagram, HL1 lights up, after the capacitor (healthy) is charged, it goes out. Resistor R1 together with R4 determines the input impedance of the probe, which allows you to change its sensitivity. When moving the resistor slider to the left according to the scheme (increase in resistance):
By the moment the LEDs light up when the R1 engine rotates, you can estimate the voltage value or resistance of the ringing circuit (resistor), and by counting the HL1 burning time when checking capacitors, you can estimate their capacitance. Additionally, the probe can be used for:
There are no critical parts in the probe. Everything depends on the requirements. You can make it in the form of a small probe or even a bracelet using surface mount elements, build it into a frequently used measuring device (tester), etc. Transistors can be replaced with KT315 / KT361 or KT3102 / KT3107. LEDs - any, if their brightness is sufficient at a current of 0,5 mA (for example, KIPD-05A). The K564LA7 chip can be replaced with the K561LA7. Resistor R1 type SP3-41. In addition to its small size (diameter 8 mm), it also has digitization on the adjusting dial. Sockets XS1 - XS3 - contacts from lamp panels. As a power source, you can use almost any "clock" cells or one 3-volt lithium cell. The current consumed by the probe in standby mode is 6 - 7 μA, in operating mode 0,5 - 1,5 mA, so, for example, elements of a size of 7,9 * 3,6 mm (STs-21) will last several months. Similar probes, made according to different schemes, have been used by me since 1993. Here is another one, more complex, but providing more LED current: If there is a slight illumination of the LEDs in standby mode, a capacitor with a capacity of about 1 pF should be connected between the bases and emitters of transistors VT2, VT100. The figure shows one of the design options for the probe. Author: Khafizov Razil, elec@udm.net, Sarapul, Udmurtia; Publication: cxem.net See other articles Section Measuring technology. Read and write useful comments on this article. Latest news of science and technology, new electronics: Machine for thinning flowers in gardens
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