Semiconductor converters and devices (hereinafter referred to as converters)

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ENCYCLOPEDIA OF RADIO ELECTRONICS AND ELECTRICAL ENGINEERING
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Annex 3. Standards for testing electrical equipment and apparatus for electrical installations of consumers

Semiconductor converters and devices (hereinafter referred to as converters)

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Encyclopedia of radio electronics and electrical engineering / Rules for the technical operation of consumer electrical installations (PTE)

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K, T, M, - are produced within the time limits established by the PPR system

Name of the test	Type of test	Test norms	Directions
3.1. Measurement of insulation resistance of current-carrying parts	K, M	Not less than 5 Mohm	It is carried out in a cold state and with an empty cooling system for the power section with a megohmmeter for a voltage of 2500 V, for secondary switching circuits - with a megohmmeter for a voltage of 1000 V. All thyristors, valves, capacitors, transformer windings should be short-circuited for the duration of the test
3.2. Testing with increased voltage of industrial frequency of insulation of the current-carrying circuits of the unit relative to the case and between circuits that are not connected to each other	K, M	See table. 7 (Appendix 3.1). Test duration - min.	Power circuits of alternating and rectified voltages must be electrically connected during the test
3.3. Checking the operating modes of power semiconductor devices:
1) scatter in the distribution of currents along the parallel branches of thyristors or valves	K, T, M	No more than 15% of the average value of the current through the branch
2) scatter in the voltage distribution over the series-connected thyristors and valves	K, T, M	No more than 20% of the average value
3) measurement of anode-cathode resistance on all thyristors (checking the absence of breakdown)	K, T, M	Resistance spread no more than 10%	Measured with an ohmmeter
4) checking the absence of a break in the valves (measuring the forward and reverse voltage drops on the valves)	K, M	The voltage drop across the valves must be within the factory specifications	Measured with a voltmeter or oscilloscope at current limit
3.4. Measurement of the resistance of the windings of the transformer of the unit (rectifier, series, etc.)	К	Reduction relative to the results of factory tests no more than 65%	The measurement data must be brought to the same temperature as the factory data.
3.5. Testing the thyristor control system	K, T, M	It is produced in the volume and according to the method provided for by the technical specifications and factory instructions.	-
3.6. Checking the cooling system of thyristors and valves	K, T, M	The temperature must remain within normal limits	Produced according to the manufacturer's method
3.7. Removal of working, adjusting, dynamic and other characteristics	К	Deviations from the specified characteristics must remain within the limits established by the manufacturer	Also
3.8. Checking unit transformers	K, M	Produced in accordance with the instructions of chapter 3.6 and the instructions of the manufacturers

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